We try our best to provide better products for the customers through continuous technology developments.
We consider various characteristics of products on the basis of NAND cells , Firmware Algorithm and interface.
There are products compliance tests, reliability tests and interface compliance tests and diverse debugging tests.
We will try to find out all of the possible failure mechanisms of the Storage ,Interface and firmware before supplying the products.
We also provide failure analysis services from visual examination to electrical tests to identify root cause.
1. Specification Base Component Test
. Simple Host Interface test
. Mode to Mode all function test
2. Firmware Algorithm Validation Test
. Performance Measure in Clean & Dirty Condition
. Field Firmware Update SPOR Test
. Firmware Algorithm Base Long Term Reliability Test
. Long Term Random Test
3. Nand Reliability Validation
. Nand Defense Algorithm Base Reliability Test
. LDPC/BCH Recovery Aging Test (ex. Fault Injection)
. Specification Base Mass Production Validation
. Effective test time (Mass Process Optimization, Test Firmware Development)
. Test Item : Burn-in , AC/DC Test, Full Function Test , Hot/Cold Test
. Development Test Program : eMMC 5.0 , eMCP(eMMC5.0 + LPDDR All Version)
. Next Test Program : UFS 2.0
. Future Product : SSD (NVMe) , SD, USB
TSP Test Scenario Sample Example to NAND Reliability Validation
1. During Intensive read operation, wordlines of the same blocks are applied some Vpass voltage stresses.
therefore, Intensive read operation could be happen to data error at near wordlines/unselected wordline
2. Firmware Work Around Algorithm about Host Intensive Read
Case1. Intensive read block could be replaced by intensive read count value of Nand Physical block
Case2. Intensive read block could be replaced by Random Internal Near page algorithm
Case3. Intensive read addresses could be changed other block’s addresses to remove the sources of
3. Scenario Concept : After Intensive Reading, full area could be verified